book
#1527
621.39 SHA s ISBN:
Technology » Engineering & allied operations » Applied physics
Subjects:Teknik Elektro Dynamic

    Semiconductor Memories : Technology, Testing, and Reliability --

    Ashok K. Sharma / / /
    IEEE Solid- State Circuits Council New York 1997
    xii; 462 h; ilus 25 cm Bahasa:Eng

    Book 'Semiconductor Memories : Technology, Testing, and Reliability' by Ashok K. SharmaIEEE Solid- State Circuits Council

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